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SPOT Imaging Software

Original price $659.00 - Original price $659.00
Original price
$659.00
$659.00 - $659.00
Current price $659.00

SPOT Advanced 5.6 Microscope Imaging Software

Diagnostic Instruments

SPOT Advanced 5.6 Microscope Imaging Software is the full-featured SPOT imaging platform for users who need more than routine image capture. It p...

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Original price $659.00 - Original price $659.00
Original price
$659.00
$659.00 - $659.00
Current price $659.00
Original price $208.00 - Original price $208.00
Original price
$208.00
$208.00 - $208.00
Current price $208.00

SPOT Basic 5.6 Microscope Imaging Software

Diagnostic Instruments

SPOT Basic 5.6 Microscope Imaging Software provides essential image acquisition, measurement, annotation, reticle, scale bar, and documentation t...

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Original price $208.00 - Original price $208.00
Original price
$208.00
$208.00 - $208.00
Current price $208.00

SPOT Imaging Software provides image acquisition, measurement, annotation, reporting, and image management tools for SPOT microscope cameras. Choose from SPOT Basic software for routine microscopy imaging or SPOT Advanced software for research, fluorescence imaging, measurement, automation, and advanced workflow requirements.

SPOT software is used in clinical laboratories, pathology, life science research, industrial inspection, materials science, and educational microscopy environments. Available features include live image capture, calibrated measurement tools, annotations, scale bars, image enhancement, reporting, user profiles, and advanced workflow modules.

Advanced modules are available for quantitative imaging, extended depth of focus (EDF), image overlays, peripheral device control, and third-party software integration. SPOT software is designed to work seamlessly with SPOT Insight, RT sCMOS, HDVision, and IDEA microscope cameras.

Empire Optics supplies complete SPOT imaging solutions including cameras, software, accessories, and application support for clinical, educational, industrial, and research microscopy.

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